QCEPT INVESTMENTS LLC

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS891
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 258
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 157
 
  
 
G01H MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES 120
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9625557 Work function calibration of a non-contact voltage sensorMay 22, 14Apr 18, 17[G01R]
8275564 Patterned wafer inspection system using a non-vibrating contact potential difference sensorJan 26, 10Sep 25, 12[G01D]
7900526 Defect classification utilizing data from a non-vibrating contact potential difference sensorNov 30, 07Mar 08, 11[G01N]
7752000 Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motionMay 02, 08Jul 06, 10[G01D]
7379826 Semiconductor wafer inspection systemAug 15, 06May 27, 08[G01B]
7337076 Inspection system and apparatusSep 12, 06Feb 26, 08[G01B]
7308367 Wafer inspection systemFeb 03, 04Dec 11, 07[G01B]
7152476 Measurement of motions of rotating shafts using non-vibrating contact potential difference sensorJul 23, 04Dec 26, 06[G01H]
7107158 Inspection system and apparatusMar 11, 05Sep 12, 06[G01B]
7103482 Inspection system and apparatusAug 05, 04Sep 05, 06[G01B]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7659734 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illuminationExpiredMar 07, 07Feb 09, 10[G01R]
7634365 Inspection system and apparatusExpiredFeb 25, 08Dec 15, 09[G01B]
6957154 Semiconductor wafer inspection systemExpiredJul 29, 03Oct 18, 05[H01L, B08B, G01B]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.